DocumentCode :
61954
Title :
Enhancing Light Output of GaN-Based LEDs With Graded-Thickness Quantum Wells and Barriers
Author :
Bin Cao ; Run Hu ; Zhiyin Gan ; Sheng Liu
Author_Institution :
Sch. of Opt. & Electron. Inf., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
25
Issue :
18
fYear :
2013
fDate :
Sept.15, 2013
Firstpage :
1762
Lastpage :
1765
Abstract :
GaN-based light-emitting diodes (LEDs) with graded-thickness quantum wells and barriers (GMQW-LEDs) are fabricated and researched in this letter. The light power and carrier distribution of GMQW-LEDs are compared with those of LEDs with original uniform MQW (OR-LEDs), graded-thickness quantum wells (GQW-LEDs), and graded-thickness quantum barriers (GQB-LEDs) through numerical simulation, respectively. The experimental results show that light power of GMQW-LEDs is enhanced significantly compared with that of OR-LEDs. The simulation results reveal that GMQW-LEDs show light output power enhancements of 25.7%, 14.3%, and 9.2% compared with OR-LEDs, GQW-LEDs, and GQB-LEDs at current density of 100 A/cm2, respectively. This is due to the superior hole distribution in quantum wells, which inhibits the electron leakage and enhances the radiative recombination.
Keywords :
III-V semiconductors; current density; electron-hole recombination; gallium compounds; light emitting diodes; numerical analysis; quantum well devices; semiconductor quantum wells; wide band gap semiconductors; GaN; GaN-based LED; GaN-based light-emitting diodes; carrier distribution; current density; electron leakage; graded-thickness quantum barriers; graded-thickness quantum wells; hole distribution; light output power enhancements; numerical simulation; radiative recombination; Charge carrier processes; Current density; Gallium nitride; Light emitting diodes; Power generation; Quantum well devices; Radiative recombination; Light-emitting diodes (LEDs); carrier distribution; quantum barriers; quantum wells;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2275166
Filename :
6571210
Link To Document :
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