• DocumentCode
    619561
  • Title

    Single-photon image sensors

  • Author

    Charbon, E. ; Regazzoni, Francesco

  • Author_Institution
    Tech. Univ. Delft, Delft, Netherlands
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The main goal of this paper is to expose the EDA community to the emerging class of circuits operating with single quanta of energy (e.g. photons or electrical carriers). We describe recent developments in the field of single-photon detection and single-photon imaging based on the avalanche effect. Single-photon detection is useful in a number of applications, from time-of-flight based 3D vision systems to fluorescence lifetime imaging microscopy, from low-light cameras to quantum random number generators, from positron emission tomography to time-resolved Raman spectroscopy. These applications have speed and accuracy requirements that conventional systems cannot provide if not at a very high cost. EDA has not yet adapted to the revolution introduced by avalanching devices and, though tools capable of simulating these devices exist, there is little or no capability to do so in a coherent flow, let alone at system level. We challenge CAD designers to fill this gap and prepare them to the circuits of the future, quantum in nature but built in standard CMOS technology.
  • Keywords
    CMOS image sensors; avalanche diodes; cameras; photodetectors; CAD design; CMOS technology; EDA community; avalanche effect; camera; fluorescence lifetime imaging microscopy; positron emission tomography; quantum random number generator; single photon detection; single photon image sensor; single photon imaging; time resolved Raman spectroscopy; time-of-flight based 3D vision system; CMOS integrated circuits; CMOS technology; Cameras; Image sensors; Photonics; Silicon; EDA; SPAD; SiPM; Single-photon detection; photon counting; silicon photomultiplier; single-photon avalanche diode; time-resolved imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560720