• DocumentCode
    619562
  • Title

    Non-volatile FPGAs based on spintronic devices

  • Author

    Goncalves, O. ; Prenat, G. ; Di Pendina, G. ; Dieny, Bernard

  • Author_Institution
    Spintec, UJF, Grenoble, France
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper presents an innovative architecture for radiation-hardened FPGA (Field Programmable Gate Array). This architecture is based on the use of MTJs (Magnetic Tunnel Junctions), magnetic nanostructures used as basic elements of MRAM (Magnetic Random Access Memory). These devices are totally immune to radiations and can be used as a reference memory to perform “scrubbing” techniques, which consist in regularly reloading the configuration of the FPGA to fix the radiation induced errors that may have occured. This approach allows hardening the circuits at low cost in terms of area, while reducing the standby power consumption and offering new functionalities, like dynamic reconfiguration. A silicon demonstrator was implemented, including a 2-inputs LUT (Look Up Table) and tested using a digital tester, giving encouraging results.
  • Keywords
    MRAM devices; elemental semiconductors; field programmable gate arrays; magnetic tunnelling; magnetoelectronics; radiation hardening (electronics); silicon; 2-input LUT; 2-input look up table; MRAM basic elements; MTJ; magnetic nanostructures; magnetic random access memory basic elements; magnetic tunnel junctions; nonvolatile FPGA; power consumption; radiation induced errors; radiation-hardened FPGA; radiation-hardened field programmable gate array; scrubbing techniques; silicon demonstrator; spintronic devices; Field programmable gate arrays; Junctions; Magnetic switching; Magnetic tunneling; Random access memory; Switches; Table lookup; DRAM; FPGA; LUT; MRAM; MTJ; radiation hardning; scrubbing; soft error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560721