DocumentCode :
619592
Title :
Power and signal integrity challenges in 3D systems
Author :
Corbalan, Miguel Miranda ; Keval, Anup ; Toms, Thomas ; Lisk, Durodami ; Radojcic, Riko ; Nowak, Marcjan
Author_Institution :
Qualcomm Technol., Inc., San Diego, CA, USA
fYear :
2013
fDate :
May 29 2013-June 7 2013
Firstpage :
1
Lastpage :
4
Abstract :
Power/signal delivering network for 2D systems comprising a package and an Integrated Circuit (IC) are design tasks that can be concurrently handled today. Design iterations can be locally carried out in each subsystem part without the need to modify the other one´s decisions. This is unfortunately not the case in 2.5D/3D stacked systems. Finer system integration technology, either via Through Silicon Stack (TSS) and/or Through Silicon Interposer (TSI), involves tighter evaluation of the coupling effects in the system-wide PDN impedance and Signal Integrity (SI) characteristics. If these interactions are not properly accounted early in the design cycle, undesired design loop iterations, affecting design productivity is possible. Therefore, new tools and flows incorporating abstracted physical information of the PDN and signal interconnect stack architecture are needed for early design exploration. This paper elaborates on the problems, tool flows and methods necessary to address these challenges for 2.5D/3D stacked systems.
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit packaging; silicon; three-dimensional integrated circuits; 2.5D-3D stacked system; 2D systems; 3D system; IC design; PDN; SI characteristics; TSI; TSS; design loop iteration; finer system integration technology; integrated circuit design; integrated circuit packaging; power integrity; power-signal delivering network; signal integrity characteristics; system-wide PDN impedance; through silicon interposer; through silicon stack; Impedance; Integrated circuit interconnections; Resonant frequency; Silicon; Sociology; Through-silicon vias; Power Delivering Networks; Power and Signal Integrity; Through Silicon Interposer (TSI) design; Through Silicon Stack (TSS);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
Conference_Location :
Austin, TX
ISSN :
0738-100X
Type :
conf
Filename :
6560754
Link To Document :
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