• DocumentCode
    619610
  • Title

    InTimeFix: A low-cost and scalable technique for in-situ timing error masking in logic circuits

  • Author

    Feng Yuan ; Qiang Xu

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Shatin, China
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    With technology scaling, integrated circuits (ICs) suffer from increasing process, voltage, and temperature (PVT) variations and adverse aging effects. In most cases, these reliability threats manifest themselves as timing errors on critical speed-paths of the circuit, if a large design guard band is not reserved. This work presents a novel in-situ timing error masking technique, namely InTimeFix, by introducing fine-grained redundant approximation circuit into the design to provide more timing slack for speed-paths. The synthesis of the redundant circuit relies on simple structural analysis of the original circuit, which is easily scalable to large IC designs. Experimental results show that InTimeFix significantly increases circuit timing slack with low area/power cost.
  • Keywords
    integrated circuit design; logic circuits; masks; IC designs; InTimeFix; adverse aging effects; critical speed-paths; in-situ timing error masking; integrated circuits; logic circuits; technology scaling; timing slack; Approximation methods; Benchmark testing; Delays; Hardware; Law; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560776