• DocumentCode
    619859
  • Title

    Local model based KPLS with application to fault detection of batch process

  • Author

    Hu Yi ; Ma Hehe ; Shi Hongbo

  • Author_Institution
    Key Lab. of Adv. Control & Optimization for Chem. Processes of Minist. of Educ., East China Univ. of Sci. & Technol., Shanghai, China
  • fYear
    2013
  • fDate
    25-27 May 2013
  • Firstpage
    1097
  • Lastpage
    1103
  • Abstract
    To handle the problems of nonlinearity, dynamic and multiphase in batch processes, a novel online modeling and monitoring method based on local model and kernel partial least squares (KPLS) is proposed. The improved local modeling method not only utilizes the information of the current time slice, but also incorporates the information of the nearby time slices. The local model can reflect the changes of operating process, so it can be used to monitor processes with time-varying behavior and operating phase change. Besides, KPLS is employed to model the nonlinear information of the process. A case study of the semiconductor process illustrated that the proposed approach can effectively monitor the batch process.
  • Keywords
    batch processing (industrial); least squares approximations; process monitoring; batch process; fault detection; kernel partial least squares; local model Based KPLS; process monitoring; semiconductor process; time slice; Batch production systems; Electronic mail; Fault detection; Kernel; Monitoring; Semiconductor device modeling; Semiconductor process modeling; Batch Process; Fault Detection; Kernel Partial Least Squares; Local Model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2013 25th Chinese
  • Conference_Location
    Guiyang
  • Print_ISBN
    978-1-4673-5533-9
  • Type

    conf

  • DOI
    10.1109/CCDC.2013.6561088
  • Filename
    6561088