Title :
Monolithic Integration of E/D-Mode AlGaN/GaN MIS-HEMTs
Author :
Yuechan Kong ; Jianjun Zhou ; Cen Kong ; Youtao Zhang ; Xun Dong ; Haiyan Lu ; Tangsheng Chen ; Naibin Yang
Author_Institution :
Sci. & Technol. on Monolithic Integrated Circuits & Modules Lab., Nanjing Electron. Devices Inst., Nanjing, China
Abstract :
Monolithic integration of enhancement/depletion (E/D)-mode AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors (MIS-HEMTs) are demonstrated for mixed signal applications. The gate length for the E-mode and D-mode devices are 0.2 μm and 0.35 μm, respectively, and drain current of 496 (Vgs=+5 V) and 720 mA/mm (Vgs=0 V) with a peak transconductance of 147 and 131 mS/mm are measured. Small-signal measurements result matched current-gain cutoff frequency (fT)/maximum oscillation frequency (fmax) of 29.9/55.2 GHz for the E-mode and 27.5/47.5 GHz for the D-mode devices. Direct-coupled FET logic E/D MIS-HEMT inverter and 51-stage ring oscillator are fabricated. The incorporation of gate dielectric enables the inverter a large logic voltage swing of 3.71 V at a supply voltage VDD of 5 V. The 51-stage ring oscillator implemented with 106 transistors shows an oscillation frequency of 427.6 MHz at VDD=5 V, corresponding to a stage delay of 23 ps.
Keywords :
III-V semiconductors; MIS devices; UHF oscillators; aluminium compounds; direct coupled FET logic; gallium compounds; high electron mobility transistors; high-k dielectric thin films; microwave field effect transistors; millimetre wave field effect transistors; wide band gap semiconductors; 51-stage ring oscillator; AlGaN-GaN; D-mode devices; E-D-mode AlGaN-GaN MIS-HEMT; E-mode devices; direct-coupled FET logic E-D MIS-HEMT inverter; enhancement-depletion-mode AlGaN-GaN MIS-HEMT; frequency 27.5 GHz; frequency 29.9 GHz; frequency 427.6 MHz; frequency 47.5 GHz; frequency 55.2 GHz; gate dielectric; metal-insulator-semiconductor high-electron-mobility transistors; mixed signal applications; monolithic integration; size 0.2 mum; size 0.35 mum; small-signal measurements result; voltage 5 V; Aluminum gallium nitride; Gallium nitride; HEMTs; Inverters; Logic gates; Monolithic integrated circuits; Ring oscillators; AlGaN/GaN; direct-coupled FET logic (DCFL); enhancement/depletion (E/D) integration; gate recess; metal–insulator–semiconductor high-electron-mobility transistor (MIS-HEMT); ring oscillator;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2013.2297433