DocumentCode :
620190
Title :
Research on test technology of RFID system
Author :
Zhen-jun Guo
Author_Institution :
Inst. of Inf. & Technol., Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2013
fDate :
25-27 May 2013
Firstpage :
2793
Lastpage :
2796
Abstract :
On the basis of the RFID testing standards theoretical analysis, it designs a RFID system test platform based on the embedded Linux. It carries on the design development by hardware system´s design of test platform, the software development platform construction and the application software system´s design. It designs the application software system of test platform by Qt, and gives the application software test process, it electively assess the RFID system performance. The article analyzes the influence to the overall system performance, and carries on separately the simulation test to the RFID system from encoding method, CRC verification code and negative carrier modulation depth.
Keywords :
Linux; formal verification; radiofrequency identification; software engineering; telecommunication computing; CRC verification code; RFID system test platform; RFID testing standards theoretical analysis; embedded Linux; hardware system design; negative carrier modulation depth; software development platform construction; software system design application; test technology; Encoding; IEC standards; Modulation; Performance evaluation; Radiofrequency identification; Testing; Performance test; RFID test platform; Uniform test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Decision Conference (CCDC), 2013 25th Chinese
Conference_Location :
Guiyang
Print_ISBN :
978-1-4673-5533-9
Type :
conf
DOI :
10.1109/CCDC.2013.6561419
Filename :
6561419
Link To Document :
بازگشت