DocumentCode
620277
Title
A research on calibration of low-precision MEMS inertial sensors
Author
Ren Wei ; Zhang Tao ; Zhang Hai-yun ; Wang Lei-gang ; Zhou Yong-jie ; Luan Meng-kai ; Liu Hui-feng ; Shi Jing-wei
Author_Institution
Space Center, Tsinghua Univ., Beijing, China
fYear
2013
fDate
25-27 May 2013
Firstpage
3243
Lastpage
3247
Abstract
Micro-electromechanical systems (MEMS) are an emerging technology that has the potential for a multitude of uses. MEMS sensors are cost-effective units with small dimensions, but suffer from large random errors compared with their mechanical predecessors. It is hard to have an accurate description of sensor errors because the characteristics of errors are quite different among the MEMS inertial sensors with the same specifications. Installation errors result from the imperfection in welding the MEMS sensor which consists of a triaxial accelerometer and a triaxial gyroscope on a single-chip. Low-precision MEMS inertial sensors exhibit biases, scale factors, and large installation errors. According to the error characteristics of MEMS inertial sensors, a mathematical model was analyzed. The validity of the six-position test was verified by using the correction between the triaxial accelerometer and the triaxial gyroscope on one single-chip. One method to identify the intersection angle among the sensitive axes and the measured vector was analyzed. The test results show that the calibration can effectively correct the bias, scale factor and installation error of MEMS inertial sensors.
Keywords
accelerometers; calibration; gyroscopes; microsensors; MEMS inertial sensor bias; MEMS inertial sensor installation error; MEMS inertial sensor scale factor; low-precision MEMS inertial sensor calibration; mathematical model; measured vector; mechanical predecessor; microelectromechanical systems; sensitive axis; sensor errors; six-position test; triaxial accelerometer; triaxial gyroscope; Accelerometers; Calibration; Gyroscopes; Mathematical model; Micromechanical devices; Sensors; Vectors; Installation errors; MEMS accelerometer; MEMS gyroscope; Six-position test;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Decision Conference (CCDC), 2013 25th Chinese
Conference_Location
Guiyang
Print_ISBN
978-1-4673-5533-9
Type
conf
DOI
10.1109/CCDC.2013.6561506
Filename
6561506
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