Title :
A study of optimum material for SAW bonded wafer
Author :
Kawachi, O. ; Taniguchi, Naokazu ; Tajima, Michio ; Nishizawa, T.
Author_Institution :
TAIYO YUDEN Mobile Technol. Co., Ltd., Yokohama, Japan
Abstract :
We have proposed the use of a lithium tantalate (LiTaO3)/sapphire bonded substrate for compensation of temperature coefficient of frequency (TCF) in surface acoustic wave (SAW) duplexers. However, in the specific use case of a Band 8 SAW duplexer on Universal Mobile Telecommunications System (UMTS), this bonded substrate has exhibited spurious response in the pass-band. In this paper, we analyzed the spurious response by Finite Element Method (FEM) simulation and found that the spurious could be suppressed effectively by optimizing the cut angle of the LiTaO3 substrate. Moreover, we fabricated a Band 8 SAW duplexer with the optimized cut angle and obtained experimentally good insertion loss without degradation by the spurious response. The measured insertion losses of the duplexer were 2 dB and 2.5 dB at Tx and Rx bands, respectively.
Keywords :
3G mobile communication; finite element analysis; lithium compounds; sapphire; surface acoustic wave filters; LiTaO3-Al2O3; SAW bonded wafer; TCF; UMTS; band 8 SAW duplexer; finite element method; insertion loss; loss 2 dB; loss 2.5 dB; optimum material; spurious response; surface acoustic wave duplexers; temperature coefficient of frequency; universal mobile telecommunications system; 3G mobile communication; Computational modeling; Finite element analysis; Insertion loss; Substrates; Surface acoustic waves; Temperature; bulk wave; duplexer; lithium tantalate (LiTaO3)/sapphire bonded substrate; send a e-mail to osamu.kawachi@jmty.yuden.co.jp; surface acoustic wave (SAW);
Conference_Titel :
Ultrasonics Symposium (IUS), 2012 IEEE International
Conference_Location :
Dresden
Print_ISBN :
978-1-4673-4561-3
DOI :
10.1109/ULTSYM.2012.0314