• DocumentCode
    620802
  • Title

    pMUT for high intensity focused ultrasound

  • Author

    An Nguyen-Dinh ; Dag Wang ; Meynier, Cyril ; Tyholdt, Frode ; Vogl, A. ; Tofteberg, Hannah ; Østbø, Niels Peter ; Flesch, Etienne

  • Author_Institution
    Vermon SA, Tours, France
  • fYear
    2012
  • fDate
    7-10 Oct. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Capacitive ultrasonic tranducers, cMUTs rely on the electrostatic field between the membrane and a back plate for sensing andactuation. This is an excellent solution for small amplitudes. But the movement of the membrane is physically limited by the bottom plate (risk of collapse). Furthermore, pull-in and linearity considerations restrict the available range to about one percent of thegap. Piezoelectric micromachined ultrasonic transducers, pMUTs, on the other hand have no such restrictions. The excitation is basedon lateral contraction of a thin film of Lead Zirconate Titanate, PZT, deposited on top of the membrane. Then there is no need for abackplate, and the linear range is greatly increased. Therefore, pMUTs are ideally suited for applications demanding large excitationamplitude, such as high intensity focused ultrasound, HIFU. In this work, we present pMUTs designed for HIFU operation around 1MHz.
  • Keywords
    capacitive sensors; electric actuators; electric fields; electrostatic actuators; lead compounds; membranes; micromachining; microsensors; piezoelectric transducers; thin film sensors; ultrasonic transducers; HIFU; PZT; actuation; cMUT; capacitive ultrasonic transducer; electrostatic field; high intensity focused ultrasound; membrane deposition; pMUT; piezoelectric micromachined ultrasonic transducer; sensing; thin film lateral contraction; Acoustics; Electrodes; Finite element analysis; Frequency measurement; Harmonic analysis; Measurement by laser beam; Transducers; HIFU; MEMS; PZT deposition; micromachining; pMUT;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2012 IEEE International
  • Conference_Location
    Dresden
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-4561-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2012.0504
  • Filename
    6562169