DocumentCode
621029
Title
Cryogenic DC characterization of InAs/Al80 Ga20 Sb self-switching diodes
Author
Westlund, A. ; Moschetti, Giuseppe ; Nilsson, Per-Ake ; Grahn, Jan ; Desplanque, Ludovic ; Wallart, Xavier
Author_Institution
Dept. of Microtechnol. & Nanosci. (MC2), Chalmers Univ. of Technol., Goteborg, Sweden
fYear
2013
fDate
19-23 May 2013
Firstpage
1
Lastpage
2
Abstract
DC characterization of an InAs/Al80Ga20Sb self-switching diode for THz detection is presented at 300 K and 6 K. Compared to 300 K, an enhancement of the diode I-V nonlinearity and associated responsivity was observed under zerobias conditions at 6 K. The intrinsic responsivity was estimated to 490 V/W at 300 K and 4400 V/W at 6 K.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; submillimetre wave diodes; terahertz wave detectors; InAs-Al80Ga20Sb; THz detection; associated responsivity; cryogenic DC characterization; diode I-V nonlinearity; self-switching diodes; zerobias conditions; Cooling; Detectors; Electrical resistance measurement; HEMTs; MODFETs; Radio frequency; Resistance; InAs; SSD; THz; detector; diode; self-switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
Conference_Location
Kobe
ISSN
1092-8669
Print_ISBN
978-1-4673-6130-9
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2013.6562599
Filename
6562599
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