• DocumentCode
    621031
  • Title

    High performacne InAs/AlSb HEMT with refractory iridium Schottky gate metal

  • Author

    Wen-Yu Lin ; Chao-Hung Chen ; Hsien-Chin Chiu ; Fan-Hsiu Huang ; Hsueh, W.J. ; Yue-Ming Hsin ; Jen-Inn Chyi

  • Author_Institution
    Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In the work, a novel approach in fabricating high-performance of InAs/AlSb high electron mobility transistors using iridium (Ir) gate technology was proposed and investigated. The Ir-gate exhibited a superior metal work function which was beneficial for increasing Schottky barrier height (ØB) of InAs/AlSb heterostructure from 0.54 to 0.58 eV. The Ir-gate InAs/AlSb HEMT exhibited a Vth of -0.9 V, a maximum drain current of 270 mA/mm, and a peak transconductance of 420 mS/mm. In contrast, the Vth of Ti-gate InAs/AlSb HEMT was - 1.5 V, a maximum drain current of 257mA/mm, and a peak transconductance of 280mS /mm, respectively. It was suggested that Ir interface presented a high potential for high power transistor applications.
  • Keywords
    III-V semiconductors; Schottky barriers; aluminium compounds; high electron mobility transistors; indium compounds; iridium; refractories; HEMT; InAs-AlSb; Schottky barrier height; heterostructure; high electron mobility transistor; high power transistor; iridium gate technology; metal work function; refractory iridium Schottky gate metal; voltage -0.9 V; voltage -1.5 V; Conferences; Decision support systems; Indium phosphide; AlSb; Titanium Schottky barrier height; iridium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
  • Conference_Location
    Kobe
  • ISSN
    1092-8669
  • Print_ISBN
    978-1-4673-6130-9
  • Electronic_ISBN
    1092-8669
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2013.6562601
  • Filename
    6562601