Title :
High performacne InAs/AlSb HEMT with refractory iridium Schottky gate metal
Author :
Wen-Yu Lin ; Chao-Hung Chen ; Hsien-Chin Chiu ; Fan-Hsiu Huang ; Hsueh, W.J. ; Yue-Ming Hsin ; Jen-Inn Chyi
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Taoyuan, Taiwan
Abstract :
In the work, a novel approach in fabricating high-performance of InAs/AlSb high electron mobility transistors using iridium (Ir) gate technology was proposed and investigated. The Ir-gate exhibited a superior metal work function which was beneficial for increasing Schottky barrier height (ØB) of InAs/AlSb heterostructure from 0.54 to 0.58 eV. The Ir-gate InAs/AlSb HEMT exhibited a Vth of -0.9 V, a maximum drain current of 270 mA/mm, and a peak transconductance of 420 mS/mm. In contrast, the Vth of Ti-gate InAs/AlSb HEMT was - 1.5 V, a maximum drain current of 257mA/mm, and a peak transconductance of 280mS /mm, respectively. It was suggested that Ir interface presented a high potential for high power transistor applications.
Keywords :
III-V semiconductors; Schottky barriers; aluminium compounds; high electron mobility transistors; indium compounds; iridium; refractories; HEMT; InAs-AlSb; Schottky barrier height; heterostructure; high electron mobility transistor; high power transistor; iridium gate technology; metal work function; refractory iridium Schottky gate metal; voltage -0.9 V; voltage -1.5 V; Conferences; Decision support systems; Indium phosphide; AlSb; Titanium Schottky barrier height; iridium;
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
Conference_Location :
Kobe
Print_ISBN :
978-1-4673-6130-9
Electronic_ISBN :
1092-8669
DOI :
10.1109/ICIPRM.2013.6562601