DocumentCode
62105
Title
Pattern Recognition for Temperature-Dependent State-of-Charge/Capacity Estimation of a Li-ion Cell
Author
Jonghoon Kim ; Cho, B.H.
Author_Institution
Energy storage Syst. Dev. Group, Samsung SDI, Cheonan, South Korea
Volume
28
Issue
1
fYear
2013
fDate
Mar-13
Firstpage
1
Lastpage
11
Abstract
This paper investigates the application of the dual extended Kalman filter (DEKF) algorithm combined with the pattern recognition based on the Hamming network (HN) to the identification of suitable cell model parameters for improved state-of-charge (SOC)/capacity estimation at different temperatures. The averaged nine discharging/charging voltage-temperature (DCVT) patterns for 10 fresh Li-ion cells were measured at different temperatures, together with the cell parameters, as representative patterns. Through statistical analysis of the characteristic parameters for learning by the HN, the identification of the representative DCVT pattern that most closely matches that of the arbitrary cell to be measured at any temperature. Specifically, a detailed temperature is obtained by the temperature-checking process and is added or reduced according to representative DCVT pattern discriminated. Finally, appropriate model parameters from the proposed approach are determined and used for SOC/capacity estimation in DEKF.
Keywords
Kalman filters; lithium; nonlinear filters; pattern recognition; secondary cells; Hamming network; Li; capacity estimation; cell model parameters; discharging/charging voltage-temperature; dual extended Kalman filter; lithium-ion cell; pattern recognition; representative DCVT pattern; statistical analysis; temperature-checking process; temperature-dependent state-of-charge; Discharges (electric); Estimation; Pattern recognition; Resistance; System-on-a-chip; Temperature; Temperature measurement; Dual extended Kalman filter (DEKF); Hamming network (HN); pattern recognition; state-of-charge (SOC); temperature-dependent;
fLanguage
English
Journal_Title
Energy Conversion, IEEE Transactions on
Publisher
ieee
ISSN
0885-8969
Type
jour
DOI
10.1109/TEC.2012.2222884
Filename
6339034
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