DocumentCode :
621077
Title :
Comparative study on frequency limits of nanoscale HEMTs with various channel materials
Author :
Nagai, Yukie ; Nagai, Shuichi ; Sato, Jun ; Hara, Satoshi ; Fujishiro, Hiroki I. ; Endoh, Akira ; Watanabe, Issei ; Kasamatsu, Akifumi
Author_Institution :
Tokyo Univ. of Sci., Chiba, Japan
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
1
Lastpage :
2
Abstract :
The frequency limits in intrinsic fT of the nano-scale HEMTs with various channel materials are investigated by using the quantum-corrected Monte Carlo simulation. The device C with the InSb channel exhibits the higher intrinsic fT from the lower Vds because of the higher electron velocity. Owing to the shorter limit in the Lg scaling at the lower Vds, the device C also exhibits the higher frequency limit in the intrinsic fT, indicating its potential for the low power and THz operation.
Keywords :
Monte Carlo methods; high electron mobility transistors; HEMT; InSb; channel materials; electron velocity; quantum-corrected Monte Carlo simulation; Delays; HEMTs; Impact ionization; Logic gates; MODFETs; Materials; Strain; Band Calculation; Delay Time; HEMT; InAs; InGaAs; InSb; Quantum-Corrected Monte Carlo Simulation; Strain; THz; fT;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
Conference_Location :
Kobe
ISSN :
1092-8669
Print_ISBN :
978-1-4673-6130-9
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2013.6562649
Filename :
6562649
Link To Document :
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