DocumentCode :
621279
Title :
A 32-channel 12-bits single slope A-to-D converter for LHC environment
Author :
Vergine, Tommaso ; De Matteis, M. ; D´Amico, S. ; Chironi, Vincenzo ; Marchioro, A. ; Kloukinas, K. ; Baschirotto, A.
Author_Institution :
Dept. of Phys. G. Occhialini, Univ. of Milano Bicocca, Milan, Italy
fYear :
2013
fDate :
29-31 May 2013
Firstpage :
139
Lastpage :
142
Abstract :
The A-to-D converter here presented is part of a bigger system able to sense and monitor electrical/physical parameters in particles detectors, for LHC experiments. The CMOS integrated circuits operating in high-energy environments experience large leakage current and voltage/temperature variations. For this reason in LHC experiments, a proper sensing and monitoring system has been designed with the aim to provide real time information about the electrical/physical scenario for the detectors in LHC. The A-to-D converter has a resolution of 12 bits, is based on single slope architecture and is able to manage 32 input analog channels. The design is challenging for several reasons, considering the required conversion accuracy and the critical physical scenario. The entire A-to-D converter has been fully characterized with process-voltage-temperature variations, obtaining a definitive 11bit accuracy in the worst-case simulation corner. The A-to-D has been designed in CMOS 0.13μm technology, consumes 350μW (including dynamic power due to the digital circuits) and operates at 20MHz clock frequency, for a definitive 2.3kHz sample rate.
Keywords :
CMOS integrated circuits; analogue-digital conversion; A-to-D converter; CMOS integrated circuits; LHC environment; analog channels; digital circuits; electrical/physical parameters; frequency 2.3 kHz; frequency 20 MHz; high-energy environments; leakage current; monitoring system; particles detectors; power 350 muW; sensing system; size 0.13 mum; word length 12 bit; Clocks; Detectors; Generators; Large Hadron Collider; Leakage currents; Mirrors; Temperature sensors; A-to-D; Low-Power; Radiation Hardness; high-energy experiments;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IC Design & Technology (ICICDT), 2013 International Conference on
Conference_Location :
Pavia
Print_ISBN :
978-1-4673-4740-2
Electronic_ISBN :
978-1-4673-4741-9
Type :
conf
DOI :
10.1109/ICICDT.2013.6563322
Filename :
6563322
Link To Document :
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