• DocumentCode
    621398
  • Title

    A novel ESD protection structure used to enhance the safety of the MOSFET integrated circuitry

  • Author

    Bicleanu, Dumitru-Paul ; Nicuta, Ana-Maria ; Salceanu, Andrei

  • fYear
    2013
  • fDate
    23-25 May 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The Electrostatic Discharge Phenomenon represents a threat for electronic equipment, especially for the semiconductor devices. The present paper is focused on a novel Electrostatic Discharge Protection circuit designed to provide a secure path for the transient signals. Another innovative element in this work represents the combination between the MOSFET transistors and the Transient Voltage Suppressor diodes, with different passive components. The software platform used for simulations was PSPICE. The research undertaken in this paper is useful in electronic industry, in order to find and to choose the correct components for each of the protected circuits. Thus it could be reduced or even eliminated the effects of electrostatic discharges.
  • Keywords
    MOSFET circuits; SPICE; diodes; electrostatic discharge; safety; semiconductor devices; transients; transistor circuits; ESD protection structure; MOSFET integrated circuitry; MOSFET transistors; PSPICE; electronic equipment; electrostatic discharge phenomenon; safety; semiconductor devices; software platform; transient voltage suppressor diodes; Electrostatic discharges; Integrated circuit modeling; MOSFET; Resistance; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Topics in Electrical Engineering (ATEE), 2013 8th International Symposium on
  • Conference_Location
    Bucharest
  • Print_ISBN
    978-1-4673-5979-5
  • Type

    conf

  • DOI
    10.1109/ATEE.2013.6563442
  • Filename
    6563442