DocumentCode :
621529
Title :
Reconfigurable Triple Modular Redundant and N-Modular Redundant systems with variable Reliability in multi-processor environment
Author :
Aithal, Sachin ; Kumar, Sreerama Kumar
Author_Institution :
Dept. of ECE, Nat. Inst. of Technol. Surathkal, Surathkal, India
fYear :
2012
fDate :
14-16 Dec. 2012
Firstpage :
33
Lastpage :
38
Abstract :
Voting Logic (VL) is an important component of Triple Modular Redundant (TMR) and N-Modular Redundant (NMR) systems. A number of voting logic designs are presented in this paper. The Design Profile, Diagnosability and Reliability calculation of a word voter for TMR system is presented. The notion of reconfiguring a 4 processor design for an “unconventional” TMR and 4MR mode is introduced. Reconfiguration is implemented on the fly using a “reconfiguration instruction” with the “ON” operand in the normal program code. Processors and VL for TMR are chosen using metrics such as millions of instructions executed for processors and reliability of the VLs. The TMR or 4MR configuration can be “dissolved” by the same reconfiguration instruction with the “OFF” operand. The major contribution is the Dynamic Reconfiguration of the processors at run time for enhanced Reliability (unlike all other systems where Reliability is always a decreasing function of time). The second contribution is that TMRs are built and dissolved during normal operation, unlike original TMRs which are hard wired for lifetime operation.
Keywords :
combinational circuits; logic design; microprocessor chips; multiprocessing systems; reconfigurable architectures; redundancy; 4-processor design; 4MR configuration; 4MR mode; NMR systems; OFF operand; ON operand; TMR system; VL reliability; design profile; diagnosability calculation; dynamic reconfiguration; multiprocessor environment; normal program code; reconfigurable N-modular redundant systems; reconfigurable triple modular redundant systems; reconfiguration instruction; reliability calculation; variable reliability; voting logic design; word voter; Circuit faults; Delays; Integrated circuit reliability; Logic gates; Nuclear magnetic resonance; Tunneling magnetoresistance; Design Profiles; Diagnosable Voters; Multi-processors systems; Reconfiguration; Reliability; TMR/NMR systems; Totally self-checking circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Computing and Communications (ADCOM), 2012 18th Annual International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4799-0802-8
Type :
conf
DOI :
10.1109/ADCOM.2012.6563581
Filename :
6563581
Link To Document :
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