Title :
Entropy as a wear out indicator: The resistor example
Author :
Cuadras, A. ; Ovejas, V.J. ; Quilez, Marcos
Author_Institution :
Electron. Eng. Dept., Univ. Politec. de Catalunya, Castelldefels, Spain
Abstract :
In this contribution we aim at proposing entropy measurements in resistive elements to characterize the induced damage due to current and Joule effect dissipation. 0.25 W off the shelf resistors are biased with constant voltage and pulsed voltage signals, leading to power dissipation in the range of 2 W - 5 W, to accelerate resistor failure. Entropy is inferred from injected power with respect to temperature evolution. Results show an entropy increase as a function of time, thus being possible to define threshold entropy prior to resistor failure. Entropy generation rate also shows a sudden increase in strongly damaged resistors.
Keywords :
Joule-Thomson effect; circuit reliability; cooling; electric resistance measurement; entropy; resistors; wear resistance; Joule effect dissipation; entropy generation rate; entropy measurement; power dissipation; pulsed voltage signal; resistive element; resistor failure acceleration; shelf resistor; temperature evolution; threshold entropy prior; wear out indicator; Degradation; Entropy; Heating; Reliability; Resistors; Temperature measurement; Thermodynamics; Entropy; Joule effect; damage; reliability; resistor;
Conference_Titel :
Systems, Signals & Devices (SSD), 2013 10th International Multi-Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4673-6459-1
Electronic_ISBN :
978-1-4673-6458-4
DOI :
10.1109/SSD.2013.6564142
