• DocumentCode
    622078
  • Title

    Entropy as a wear out indicator: The resistor example

  • Author

    Cuadras, A. ; Ovejas, V.J. ; Quilez, Marcos

  • Author_Institution
    Electron. Eng. Dept., Univ. Politec. de Catalunya, Castelldefels, Spain
  • fYear
    2013
  • fDate
    18-21 March 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this contribution we aim at proposing entropy measurements in resistive elements to characterize the induced damage due to current and Joule effect dissipation. 0.25 W off the shelf resistors are biased with constant voltage and pulsed voltage signals, leading to power dissipation in the range of 2 W - 5 W, to accelerate resistor failure. Entropy is inferred from injected power with respect to temperature evolution. Results show an entropy increase as a function of time, thus being possible to define threshold entropy prior to resistor failure. Entropy generation rate also shows a sudden increase in strongly damaged resistors.
  • Keywords
    Joule-Thomson effect; circuit reliability; cooling; electric resistance measurement; entropy; resistors; wear resistance; Joule effect dissipation; entropy generation rate; entropy measurement; power dissipation; pulsed voltage signal; resistive element; resistor failure acceleration; shelf resistor; temperature evolution; threshold entropy prior; wear out indicator; Degradation; Entropy; Heating; Reliability; Resistors; Temperature measurement; Thermodynamics; Entropy; Joule effect; damage; reliability; resistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Signals & Devices (SSD), 2013 10th International Multi-Conference on
  • Conference_Location
    Hammamet
  • Print_ISBN
    978-1-4673-6459-1
  • Electronic_ISBN
    978-1-4673-6458-4
  • Type

    conf

  • DOI
    10.1109/SSD.2013.6564142
  • Filename
    6564142