• DocumentCode
    622080
  • Title

    On-line diagnosis using Orthogonal Multi-Tone Time Domain Reflectometry in a lossy cable

  • Author

    Ben Hassen, Wafa ; Auzanneau, Fabrice ; Incarbone, Luca

  • Author_Institution
    Lab. de Fiabilisation des Syst. Embarques, CEA, Gif-sur-Yvette, France
  • fYear
    2013
  • fDate
    18-21 March 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Currently, on-line wire diagnosis using reflectometry is under intensive investigation, aiming at detecting and locating faults on wiring networks while the target system is operating. The idea is to inject a broadband test signal in the network under test and analyse the signal reflected by each impedance discontinuity. However, the presence of native signals on live wires may impact the diagnosis due to interference and EMC or limited bandwidth constraints. Our proposed "Orthogonal MultiTone Time Domain Reflectometry"(OMTDR) method, based on Orthogonal Frequency Division Multiplexing (OFDM) technique, seems to be a suitable candidate for on-line diagnosis as it achieves high data rate transmission, interference robustness, bandwidth efficiency and complete spectrum control. Moreover, it allows communication among diagnosis sensors to accurately locate faults position in multi-branch wiring networks which require more than one diagnosis sensor.
  • Keywords
    OFDM modulation; cable testing; coaxial cables; electromagnetic compatibility; electromagnetic wave reflection; fault location; high-frequency transmission line measurement; interference suppression; time-domain reflectometry; wires (electric); EMC; OFDM; OMTDR; bandwidth efficiency; broadband test signal; complete spectrum control; diagnosis sensor; fault detection; fault location; high data rate transmission; impedance discontinuity; interference robustness; limited bandwidth constraint; lossy cable; multibranch wiring network; network under test; online wire diagnosis; orthogonal frequency division multiplexing; orthogonal multitone time domain reflectometry; signal reflection; Bandwidth; Circuit faults; OFDM; Sensors; Time-domain analysis; Wires; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Signals & Devices (SSD), 2013 10th International Multi-Conference on
  • Conference_Location
    Hammamet
  • Print_ISBN
    978-1-4673-6459-1
  • Electronic_ISBN
    978-1-4673-6458-4
  • Type

    conf

  • DOI
    10.1109/SSD.2013.6564144
  • Filename
    6564144