DocumentCode :
62216
Title :
Application of the Random Coupling Model to Electromagnetic Statistics in Complex Enclosures
Author :
Drikas, Zachary B. ; Gil Gil, Jesus ; Hong, Sun K. ; Andreadis, Tim D. ; Jen-Hao Yeh ; Taddese, Biniyam T. ; Anlage, Steven M.
Author_Institution :
Dept. of Tactical Electron. Warfare Div., Naval Res. Lab., Washington, DC, USA
Volume :
56
Issue :
6
fYear :
2014
fDate :
Dec. 2014
Firstpage :
1480
Lastpage :
1487
Abstract :
The effectiveness of the random coupling model (RCM) in predicting electromagnetic wave coupling to targeted electronic components within a complex enclosure is examined. In the short-wavelength limit with respect to the characteristic length of the enclosure, electromagnetic wave propagation within a large enclosure is sensitive to small changes to the interior, or to the boundaries of the enclosure. Such changes can reduce or invalidate the applicability of deterministic predictions of the electromagnetic fields at radiofrequencies (RF) in large enclosures. Under such circumstances, a statistical approach is needed to provide a better understanding of RF coupling to components within large enclosures. In this paper, we experimentally demonstrate the applicability of a statistical technique, the RCM, to estimate the probabilistic magnitudes of RF fields on electrically large components (i.e., long cables, etc.) that are partially shielded within a complex, 3-D enclosure.
Keywords :
electromagnetic compatibility; electromagnetic coupling; electromagnetic field theory; electromagnetic wave propagation; statistical analysis; RCM; RF coupling; RF field probabilistic magnitudes; complex 3D enclosure; complex enclosures; electrically large components; electromagnetic field deterministic predictions; electromagnetic statistics; electromagnetic wave coupling prediction; electromagnetic wave propagation; electronic components; enclosure characteristic length; radio frequency; random coupling model; short-wavelength limit; statistical approach; Cavity resonators; Couplings; Frequency measurement; Impedance; Ports (Computers); Scattering; Transmission line matrix methods; Electromagnetic compatibility (EMC); overmoded enclosures; probability density function; random coupling model (RCM); statistical electromagnetism; wave scattering;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2014.2337262
Filename :
6894588
Link To Document :
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