DocumentCode
62216
Title
Application of the Random Coupling Model to Electromagnetic Statistics in Complex Enclosures
Author
Drikas, Zachary B. ; Gil Gil, Jesus ; Hong, Sun K. ; Andreadis, Tim D. ; Jen-Hao Yeh ; Taddese, Biniyam T. ; Anlage, Steven M.
Author_Institution
Dept. of Tactical Electron. Warfare Div., Naval Res. Lab., Washington, DC, USA
Volume
56
Issue
6
fYear
2014
fDate
Dec. 2014
Firstpage
1480
Lastpage
1487
Abstract
The effectiveness of the random coupling model (RCM) in predicting electromagnetic wave coupling to targeted electronic components within a complex enclosure is examined. In the short-wavelength limit with respect to the characteristic length of the enclosure, electromagnetic wave propagation within a large enclosure is sensitive to small changes to the interior, or to the boundaries of the enclosure. Such changes can reduce or invalidate the applicability of deterministic predictions of the electromagnetic fields at radiofrequencies (RF) in large enclosures. Under such circumstances, a statistical approach is needed to provide a better understanding of RF coupling to components within large enclosures. In this paper, we experimentally demonstrate the applicability of a statistical technique, the RCM, to estimate the probabilistic magnitudes of RF fields on electrically large components (i.e., long cables, etc.) that are partially shielded within a complex, 3-D enclosure.
Keywords
electromagnetic compatibility; electromagnetic coupling; electromagnetic field theory; electromagnetic wave propagation; statistical analysis; RCM; RF coupling; RF field probabilistic magnitudes; complex 3D enclosure; complex enclosures; electrically large components; electromagnetic field deterministic predictions; electromagnetic statistics; electromagnetic wave coupling prediction; electromagnetic wave propagation; electronic components; enclosure characteristic length; radio frequency; random coupling model; short-wavelength limit; statistical approach; Cavity resonators; Couplings; Frequency measurement; Impedance; Ports (Computers); Scattering; Transmission line matrix methods; Electromagnetic compatibility (EMC); overmoded enclosures; probability density function; random coupling model (RCM); statistical electromagnetism; wave scattering;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2014.2337262
Filename
6894588
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