DocumentCode :
622602
Title :
Be expert in multiple aspects and good at many modular neural network with reduced subnet relative training complexity
Author :
Jiasen Wang ; Chao Huang ; Xudong Ye
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
fYear :
2013
fDate :
12-14 June 2013
Firstpage :
1306
Lastpage :
1311
Abstract :
This paper mainly aims at reducing relative learning complexity of subnets originate from “be Expert in Multiple aspects and Good at Many” (EMGM) modular neural network (MNN). Firstly, subnet learning algorithm which has a pure sequential execution style is built and convergence analysis is given. Secondly, in EMGM MNN system, an equivalent learning condition, which satisfies the criterion needed for the efficient training algorithm designed before, is founded for every subnet. Three identification problems have been involved to test the effectiveness and efficiency of the new framework in dealing with low dimension data. Both theoretical and experimental results show the new framework will reduce relative learning complexity of every subnet. The experiment result also shows new framework can achieve comparable generalization capability with original one. Furthermore, Bias Variance analysis shows maximum ability of generalization performance improvement of EMGM MNN may exist and the improvement comes from the improvement of bias estimation accuracy.
Keywords :
learning (artificial intelligence); neural nets; EMGM MNN system; bias estimation accuracy; bias variance analysis; convergence analysis; expert in multiple aspects and good at many modular neural network; generalization capability; identification problems; learning condition; relative learning complexity reduction; sequential execution style; subnet learning algorithm; subnet relative training complexity reduction; Algorithm design and analysis; Complexity theory; Multi-layer neural network; Neurons; Optimization; Training; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Automation (ICCA), 2013 10th IEEE International Conference on
Conference_Location :
Hangzhou
ISSN :
1948-3449
Print_ISBN :
978-1-4673-4707-5
Type :
conf
DOI :
10.1109/ICCA.2013.6565054
Filename :
6565054
Link To Document :
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