• DocumentCode
    623471
  • Title

    Research on testability modeling with Bayesian network based on multi-signal flow model

  • Author

    Chunling Yang ; Siwen Zhang ; Chenmin Tong ; Dazhong Gu

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
  • fYear
    2013
  • fDate
    19-21 June 2013
  • Firstpage
    1870
  • Lastpage
    1873
  • Abstract
    As the method of testability modeling and analysis, multi-signal flow model is now widely used. It can describe the certain dependency matrix between faults and tests, but it doesn´t have the ability to describe the uncertain relation between faults and tests. In reality, the uncertain factors can be found everywhere in the process of testing, so the uncertainty of testing is taken into consideration in this paper. The fault detection rate and fault isolation rate can be calculated on the basis of the uncertain dependency matrix. The method proposed in this paper is verified by building the model of filter circuit.
  • Keywords
    belief networks; circuit reliability; circuit testing; fault diagnosis; filters; matrix algebra; network analysis; Bayesian network; dependency matrix; fault detection rate; fault isolation rate; filter circuit testing; multisignal flow model; testability modeling research; uncertain factors; uncertain relation; Analytical models; Bayes methods; Circuit faults; Fault detection; Finite impulse response filters; Integrated circuit modeling; Mathematical model; Bayesian network; multi-signal flow model; testability modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2013 8th IEEE Conference on
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4673-6320-4
  • Type

    conf

  • DOI
    10.1109/ICIEA.2013.6566672
  • Filename
    6566672