DocumentCode :
623502
Title :
“Scaling” the impact of EDA education Preliminary findings from the CCC workshop series on extreme scale design automation
Author :
Bahar, Iris ; Jones, Alex K. ; Katkoori, Srinivas ; Madden, Patrick H. ; Marculescu, Diana ; Markov, Igor L.
fYear :
2013
fDate :
2-3 June 2013
Firstpage :
64
Lastpage :
67
Abstract :
The breakdown of Dennard scaling implies radical changes in the design, integration, manufacturing and deployment of new electronic systems. These changes, along with labor-force and macro-economic trends, undermine the status quo in the semiconductor and electronic design automation (EDA) fields. Of particular concern is a fairly static and aging workforce and a decline in new students interested in these fields. Recognizing the dramatic changes afoot, a series of Computing Community Consortium (CCC) sponsored workshops have been organized to identify key steps to take, to secure the future growth of the electronics industry. This paper shares some preliminary findings from the first of these workshops emphasizing challenges in finding and preparing the next generation of electronic design professionals.
Keywords :
computer science education; electronic design automation; electronic engineering education; labour resources; macroeconomics; semiconductor industry; CCC sponsored workshop; Dennard scaling breakdown; EDA education; aging workforce; computing community consortium sponsored workshop; electronic design automation; electronic design professional; electronic industry; electronic system deployment; electronic system design; electronic system integration; electronic system manufacturing; fairly-static workforce; labor force; macroeconomic trend; semiconductor field; Conferences; Design automation; Educational institutions; Electronics industry; Market research;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Systems Education (MSE), 2013 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4799-0139-5
Type :
conf
DOI :
10.1109/MSE.2013.6566706
Filename :
6566706
Link To Document :
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