DocumentCode :
624163
Title :
Feature ranking using Gini index, scatter ratios, and nonlinear SVM RFE
Author :
Test, Erik ; Zigic, Ljiljana ; Kecman, Vojislav
Author_Institution :
Virginia Commonwealth Univ., Richmond, VA, USA
fYear :
2013
fDate :
4-7 April 2013
Firstpage :
1
Lastpage :
5
Abstract :
This paper introduces three feature ranking (FR) methods using seven classification benchmarks created by Exhaustive Search (ES) which selected the best feature subsets. Next, three different FR approaches are compared and ranked in respect to the top five best feature subsets for each data set obtained by ES. The results show that Gini index (GI) outperforms scatter ratios for multi-class problems on average. However, for binary classification, scatter ratios shows better performance. Nonlinear support vector machines for recursive feature elimination (NL SVM RFE) was run on three binary benchmarks and it leads to rankings closest to ES on average over GI and scatter ratio methods.
Keywords :
feature extraction; pattern classification; recursive estimation; search problems; support vector machines; FR methods; Gini Index; binary benchmarks; binary classification; exhaustive search; feature ranking; nonlinear SVM RFE; nonlinear support vector machines; recursive feature elimination; scatter ratios; Accuracy; Benchmark testing; Glass; Indexes; Kernel; Machine learning algorithms; Support vector machines; Embedded System; Exhaustive Search; Feature Ranking; Filter; Nonlinear Support Vector Recursive Feature Elimination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon, 2013 Proceedings of IEEE
Conference_Location :
Jacksonville, FL
ISSN :
1091-0050
Print_ISBN :
978-1-4799-0052-7
Type :
conf
DOI :
10.1109/SECON.2013.6567380
Filename :
6567380
Link To Document :
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