Title :
Functional integration for smart CMOS imagers: Dynamic range enhancement & gamma correction
Author :
Saffih, Fayçal ; Hornsey, Richard
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
In this paper, we demonstrate analytically novel approach for Gamma Correction (GC) built at the pixel level. The analysis is based on the estimation of the dynamic range enhancement using the spatially varying time (SVE) leading its use as a Gamma-correction function. This work shows another approach of function integration where a technique (in this case SVE) used in a specific application is also used to deliver an additional functionality (in this case Gamma correction). This is what we believe is another aspect of CMOS image sensing namely intelligence in functional integration.
Keywords :
CMOS image sensors; intelligent sensors; GC; SVE; dynamic range enhancement estimation; gamma correction approach; smart CMOS image sensor; spatially varying time; CMOS image sensors; CMOS integrated circuits; Dynamic range; Educational institutions; Quantization (signal); Sensitivity; Gamma Correction; dynamic range enhancement; functional integration. Active pixel sensor; smart CMOS image sensor;
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2013 26th Annual IEEE Canadian Conference on
Conference_Location :
Regina, SK
Print_ISBN :
978-1-4799-0031-2
Electronic_ISBN :
0840-7789
DOI :
10.1109/CCECE.2013.6567807