DocumentCode
625259
Title
Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters
Author
Devarakond, Shyam ; Banerjee, Debashis ; Banerjee, Adrish ; Sen, Satyaki ; Chatterjee, Avhishek
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2013
fDate
27-30 May 2013
Firstpage
1
Lastpage
6
Abstract
A low cost methodology for simultaneous testing and tuning of multiple chains of MIMO-OFDM wireless transmitter for system-level specifications is presented. Bandwidth-partitioned test stimuli enable the determination of the behavioral characteristics of the different chains of the RF transmitter using a one-time data acquisition. The determined behavioral characteristics of the transmitters are then correlated to system-level specifications in the simulation environment. Using the test setup, a power conscious system-level tuning approach for yield improvement is developed for tuning of parametric deviations. A yield improvement of 20% is obtained using the proposed methodology. Finally, an adaptive tuning approach is presented for those devices that face increased reliability risks/power-budget violations due to the excessive power consumption caused by post-manufacturing tuning. The tuning methodology achieves new performance metrics for these devices that attempt to maximize the conditions under which the device operates. Significant improvement in yield is obtained using the adaptive tuning methodology. Preliminary hardware validation of the proposed methodology using off the shelf components is performed.
Keywords
MIMO communication; OFDM modulation; telecommunication network reliability; MIMO-OFDM wireless transmitters; RF transmitter; adaptive tuning; behavioral characteristics; data acquisition; efficient system level testing; multiple chain tuning; parametric deviations; post manufacturing tuning; power consumption; reliability risks-power budget violations; simulation environment; system level specifications; MIMO; Performance evaluation; Power demand; Radio frequency; Testing; Transmitters; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location
Avignon
Print_ISBN
978-1-4673-6376-1
Type
conf
DOI
10.1109/ETS.2013.6569363
Filename
6569363
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