Title :
Aggresive scan chain masking for improved diagnosis of multiple scan chain failures
Author :
Kundu, Sandipan ; Chattopadhyay, Subrata ; Sengupta, Indranil ; Kapur, R.
Author_Institution :
Indian Inst. of Technol. Kharagpur, Kharagpur, India
Abstract :
When multiple chains, mapped to the same compactor output fail, AND-gate masking logic at the compactor side can be used to aid in diagnosis. The basic idea is: if for some pattern, only one faulty chain is observed and all the other faulty chains are masked, then the corresponding compacted response will only be affected by the non-masked faulty chain. Such a test pattern will help to diagnose that chain.
Keywords :
encoding; failure analysis; logic gates; logic testing; AND-gate masking logic; aggresive scan chain masking; chain diagnosis; compactor; multiple scan chain failures diagnosis; nonmasked faulty chain; test pattern; Circuit faults; Compaction; Electronic mail; Encoding; Europe; Fault detection; Observability;
Conference_Titel :
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location :
Avignon
Print_ISBN :
978-1-4673-6376-1
DOI :
10.1109/ETS.2013.6569383
