Title :
PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information
Author :
Potluri, Sreeram ; Trinadh, Satya ; Baskaran, R. ; Chandrachoodan, Nitin ; Kamakoti, V.
Author_Institution :
Indian Inst. of Technol. Madras, Chennai, India
Abstract :
Conventional ATPG tools help in detecting only the equivalence class to which a fault belongs and not the fault itself. This paper presents PinPoint, a technique that further divides the equivalence class into smaller sets based on the capture power consumed by the circuit under test in the presence of different faults in it, thus aiding in narrowing down on the fault. Applying the technique on ITC benchmark circuits yielded significant improvement in diagnostic resolution.
Keywords :
automatic test pattern generation; circuit testing; digital circuits; fault diagnosis; ATPG tools; ITC benchmark circuits; PinPoint; capture cycle power information; circuit under test; diagnostic resolution; equivalence class; power consumption; Circuit faults; Clocks; Europe; Noise; Noise measurement; Testing; Transient analysis; Diagnostic Resolution; Power-Assisted Diagnosis;
Conference_Titel :
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location :
Avignon
Print_ISBN :
978-1-4673-6376-1
DOI :
10.1109/ETS.2013.6569384