DocumentCode :
625434
Title :
A 105GHz VCO with 9.5% tuning range and 2.8mW peak output power using coupled colpitts oscillators in 65nm bulk CMOS
Author :
Adnan, Muhammad ; Afshari, Ehsan
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
2013
fDate :
2-4 June 2013
Firstpage :
239
Lastpage :
242
Abstract :
In this work, a loop of unidirectionally coupled oscillators to demonstrate high tuning range and output power is proposed. To achieve large tuning range, two different tuning mechanisms are simultaneously exploited. First each core oscillator is tuned using a variable capacitor. Next, by controlling the phase/delay between the coupled oscillators, the entire loop dynamics and hence its frequency is tuned. In this paper, we analyze a loop of “n” coupled oscillators using Adler´s equation and derive the expression for the maximum tuning range. The proposed system is designed and implemented using four coupled Colpitts VCOs in a 65nm bulk CMOS process. The VCO achieves continuous tuning range of 9.5% at the center frequency of 105GHz with the peak output power of 2.8mW. The circuit consumes 54mW from a 1.2V supply. To the best of our knowledge, this VCO has the highest output power and tuning range among all the CMOS oscillators at or above 100GHz.
Keywords :
CMOS integrated circuits; capacitors; circuit tuning; voltage-controlled oscillators; Adler equation; CMOS oscillator; CMOS process; bulk CMOS; core oscillator; coupled Colpitts VCO; coupled Colpitts oscillator; frequency 105 GHz; frequency tuning; loop dynamics; output power; phase/delay; power 2.8 mW; power 54 mW; size 65 nm; tuning mechanism; tuning range; unidirectionally coupled oscillator; variable capacitor; voltage 1.2 V; CMOS integrated circuits; Power generation; Transistors; Tuning; Varactors; Voltage-controlled oscillators; Coupled oscillator; Injection locking; Millimeter wave circuits; Varactor; Voltage controlled oscillator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2013 IEEE
Conference_Location :
Seattle, WA
ISSN :
1529-2517
Print_ISBN :
978-1-4673-6059-3
Type :
conf
DOI :
10.1109/RFIC.2013.6569571
Filename :
6569571
Link To Document :
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