Title :
A novel load insensitive RF power amplifier using a load mismatch detection and curing technique
Author :
Donghyeon Ji ; Jooyoung Jeon ; Junghyun Kim
Author_Institution :
Dept. of Electron. & Syst. Eng., Hanyang Univ., Ansan, South Korea
Abstract :
This paper proposes a new load insensitive RF power amplifier (PA) for mobile handsets using a load mismatch detection and curing technique. The PA controls a tunable output matching network (TOMN) adaptively based on the information of a mismatched load, thereby enhancing PA performances dramatically at a mismatched load without substantial performance degradation at a matched load. A load mismatch detector and TOMN can simply be implemented by using 0.18-μm silicon on insulator (SOI) FET that are integrated with 2-μm InGaP/GaAs HBT PA MMIC into a single module. To verify the idea, the PA module has been designed and implemented especially for a linearity enhancement under load mismatch condition. With WCDMA R´99 signal at 1.95 GHz, the measured results showed that ACLR at output power of 28.25 dBm was improved by as much as 13.7 dB on the worst ACLR-load angle compared to a conventional PA. In this way, the proposed load insensitive PA can keep ACLR under -37 dBc all over the load angle at 2.5:1 voltage standing wave ratio (VSWR).
Keywords :
III-V semiconductors; MMIC power amplifiers; UHF power amplifiers; bipolar MMIC; bipolar analogue integrated circuits; field effect MMIC; field effect analogue integrated circuits; gallium arsenide; indium compounds; mobile antennas; mobile handsets; silicon-on-insulator; ACLR-load angle; HBT PA MMIC; InGaP-GaAs; PA performance enhancement; SOI FET; TOMN; VSWR; WCDMA R´99 signal; antenna mismatch; curing technique; frequency 1.95 GHz; linearity enhancement; load insensitive RF power amplifier; load mismatch condition; load mismatch detection; mobile handsets; performance degradation; silicon on insulator FET; size 0.18 mum; size 2 mum; tunable output matching network; voltage standing wave ratio; Curing; Detectors; Impedance; Linearity; Power amplifiers; Radio frequency; Switches; Antenna mismatch; SO! FET impedance mismatch detector; SOI FET TOMN; linearity enhancement; load insensitive HBT PA;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2013 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6059-3
DOI :
10.1109/RFIC.2013.6569599