DocumentCode :
625513
Title :
MFL: Method-Level Fault Localization with Causal Inference
Author :
Gang Shu ; Boya Sun ; Podgurski, Andy ; Feng Cao
Author_Institution :
EECS Dept., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
124
Lastpage :
133
Abstract :
Recent studies have shown that use of causal inference techniques for reducing confounding bias improves the effectiveness of statistical fault localization (SFL) at the level of program statements. However, with very large programs and test suites, the overhead of statement-level causal SFL may be excessive. Moreover cost evaluations of statement-level SFL techniques generally are based on a questionable assumption-that software developers can consistently recognize faults when examining statements in isolation. To address these issues, we propose and evaluate a novel method-level SFL technique called MFL, which is based on causal inference methodology. In addition to reframing SFL at the method level, our technique incorporates a new algorithm for selecting covariates to use in adjusting for confounding bias. This algorithm attempts to ensure that such covariates satisfy the conditional exchangeability and positivity properties required for identifying causal effects with observational data. We present empirical results indicating that our approach is more effective than four method-level versions of well-known SFL techniques and that our confounder selection algorithm is superior to two alternatives.
Keywords :
software fault tolerance; statistical analysis; MFL; causal inference techniques; conditional exchangeability; confounder selection algorithm; confounding bias; method-level fault localization; observational data; positivity properties; program statements; software developers; statement-level causal SFL; statistical fault localization; test suites; Algorithm design and analysis; Debugging; Equations; Heuristic algorithms; Inference algorithms; Random variables; Software; causal graph; causal inference; confounder selection; confounding bias; dynamic call graph; dynamic data dependences; positivity; statistical debugging; statistical fault localization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2013 IEEE Sixth International Conference on
Conference_Location :
Luembourg
Print_ISBN :
978-1-4673-5961-0
Type :
conf
DOI :
10.1109/ICST.2013.31
Filename :
6569724
Link To Document :
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