DocumentCode
625567
Title
Identification of Anomalies in Processes of Database Alteration
Author
Mercaldo, Francesco ; Canfora, Gerardo ; Visaggio, Corrado Aaron
Author_Institution
Dept. of Eng., Univ. of Sannio, Benevento, Italy
fYear
2013
fDate
18-22 March 2013
Firstpage
513
Lastpage
514
Abstract
Data, especially in large item sets, hide a wealth of information on the processes that have created and modified them. Often, a data-field or a set of data-fields are not modified only through well-defined processes, but also through latent processes; without the knowledge of the second type of processes, testing cannot be considered exhaustive. As a matter of fact, changes in the data deriving from unknown processes can cause anomalies not detectable by testing, which focuses on known data variation rules. History of data variations can yield information about the nature of the changes. In my work I focus on the elicitation of an evolution profile of data: the values data may assume, the change frequencies, the temporal variation of a piece of data in relation to other data, or other constraints that are directly connected to the reference domain. The profile of evolution is then used to detect anomalies in the database state evolution. Detecting anomalies in the database state evolution could strengthen the quality of a system, since a data anomaly could be the signal of a defect in the applications populating the database.
Keywords
database management systems; security of data; anomaly detection; anomaly identification; change frequency; data anomaly; data variation rules; data variations; data-fields; database alteration; database state evolution; evolution profile; latent processes; reference domain; system quality; temporal variation; well-defined processes; Association rules; Communities; Databases; History; Noise; Testing; anomaly detection; data mining; intrusion detection; outlier; pattern recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation (ICST), 2013 IEEE Sixth International Conference on
Conference_Location
Luembourg
Print_ISBN
978-1-4673-5961-0
Type
conf
DOI
10.1109/ICST.2013.72
Filename
6569780
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