Title :
New Inference for Constant-Stress Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring
Author :
Bing Xing Wang ; Keming Yu ; Zhuo Sheng
Author_Institution :
Dept. of Stat., Zhejiang Gongshang Univ., Hangzhou, China
Abstract :
Constant-stress procedures based on parametric lifetime distributions and models are often used for accelerated life testing in product reliability experiments. Maximum likelihood estimation (MLE) is the typical statistical inference method. This paper presents a new inference method, named the random variable transformation (RVT) method, for Weibull constant-stress accelerated life tests with progressively Type-II right censoring (including ordinary Type-II right censoring). A two-parameter Weibull life distribution with a scale parameter that is a log-linear function of stress is used. RVT inference life distribution parameters and the log-linear function coefficients are provided. Exact confidence intervals for these parameters are also explored. Numerical comparisons of RVT-based estimates to MLE show that the proposed RVT inference is promising, in particular for small sample sizes.
Keywords :
Weibull distribution; life testing; reliability; statistical analysis; stress analysis; RVT inference; RVT inference life distribution parameters; RVT method; RVT-based estimates; Weibull constant-stress accelerated life tests; constant-stress procedures; log-linear function; log-linear function coefficients; maximum likelihood estimation; parametric lifetime distributions; parametric lifetime models; product reliability; progressively type-II censoring; random variable transformation; statistical inference method; two-parameter Weibull life distribution; type-II right censoring; Life estimation; Maximum likelihood estimation; Random variables; Shape; Stress; Weibull distribution; Accelerated life-testing; Weibull distribution; censored data; confidence interval; maximum likelihood estimation; progressively censoring; random variable transformation;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2014.2313804