• DocumentCode
    625612
  • Title

    Pluggable Watchdog: Transparent Failure Detection for MPI Programs

  • Author

    Keun Soo Yim ; Kalbarczyk, Zbigniew ; Iyer, Ravishankar K.

  • Author_Institution
    Center for Reliable & High-performance Comput., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2013
  • fDate
    20-24 May 2013
  • Firstpage
    489
  • Lastpage
    500
  • Abstract
    This paper presents a framework and its techniques that can detect various types of runtime errors and failures in MPI programs. The presented framework offloads its detection techniques to an external device (e.g., extension card). By developing intelligence on the normal behavioral and semantic execution patterns of monitored parallel threads, the presented external error detectors can accurately and quickly detect errors and failures. This architecture allows us to use powerful detectors without directly using the computing power of the monitored system. The separation of hardware of the monitored and monitoring systems offers an extra advantage in terms of system reliability. We have prototyped our system on a parallel computer system by using an FPGA-based PCI extension card as a monitoring device. We have conducted a fault injection experiment to evaluate the presented techniques using eight MPI-based parallel programs. The techniques cover ~98.5% of faults, on average. The average performance overhead is 1.8% for techniques that detect crash and hang failures and 6.6% for techniques that detect SDC failures.
  • Keywords
    application program interfaces; computerised monitoring; failure analysis; field programmable gate arrays; message passing; multi-threading; peripheral interfaces; reliability; FPGA-based PCI extension card; MPI programs; MPI-based parallel programs; SDC failure detection; computing power; crash detection; external error detectors; fault injection experiment; parallel computer system; parallel thread monitoring; pluggable watchdog; runtime errors; semantic execution patterns; system reliability; transparent failure detection; Circuit faults; Computer crashes; Computers; Doped fiber amplifiers; Flow graphs; Hardware; Monitoring; Failure detection; fault injection; parallel program reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel & Distributed Processing (IPDPS), 2013 IEEE 27th International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1530-2075
  • Print_ISBN
    978-1-4673-6066-1
  • Type

    conf

  • DOI
    10.1109/IPDPS.2013.19
  • Filename
    6569836