Title :
Reliability of TWTAs and MPMs in orbit
Author :
Jimenez, Elena Gallego ; Jaumann, Guenther
Author_Institution :
TESAT Spacecom, Germany
Abstract :
TESAT presents the achieved reliability of its TWTAs and MPMs in orbit. Various breakdowns such as SINGLE vs. DUAL units or TWTAs vs. MPMs are presented and discussed. A comparison with the standard reliability analysis based on parts count/stress indicates significantly better reliability in orbit.
Keywords :
circuit reliability; travelling wave amplifiers; MPM; TESAT; TWTA; dual breakdowns unit; orbit; single breakdowns unit; standard reliability analysis; Estimation; Orbits; Redundancy; Satellites; Standards; Stress; Fit Rates for TWTAs; In-Orbit Reliability;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6570900
