Title :
Lifetime and reliability analysis of klystrons
Author :
Balkcum, Adam ; Habermann, Thomas
Author_Institution :
Commun. & Power Ind. Inc., Palo Alto, CA, USA
Abstract :
Repair histories for nearly 1,700 klystrons of four fundamentally different design types and applications have been monitored for up to 22 years. Statistical analysis of the failure data indicate mean time between failure values at the 90% confidence level ranging from 18 to 63 field service years for these devices.
Keywords :
klystrons; reliability; statistical analysis; klystrons; lifetime analysis; reliability analysis; statistical analysis; Cathodes; Hazards; History; Klystrons; Maintenance engineering; Monitoring; Reliability; MTBF; klystron;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6570967
