DocumentCode :
626026
Title :
Effects of random circuit fabrication errors on the mean and standard deviation of small signal gain and phase in a traveling wave tube
Author :
Rittersdorf, I.M. ; Antonsen, Thomas M. ; Chernin, D. ; Lau, Y.Y.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2013
fDate :
21-23 May 2013
Firstpage :
1
Lastpage :
2
Abstract :
This paper summarizes a calculation of the mean and standard deviation of the small signal gain and phase of a TWT in the presence of small random, axially varying perturbations in the circuit phase velocity using numerical and analytic approaches. The analytical results compare favorably with results from numerical computations in the absence of space charge effects. The effects of small pitch errors in a 210 GHz folded waveguide TWT are evaluated in an example.
Keywords :
numerical analysis; travelling wave tubes; circuit phase velocity; folded waveguide TWT; frequency 210 GHz; numerical approaches; pitch errors; random circuit fabrication errors effects; small signal gain; small signal phase; space charge effects; standard deviation; traveling wave tube; Differential equations; Educational institutions; Electron tubes; Fabrication; Space charge; Standards; fabrication tolerance; gain variation; phase variation; traveling wave tube;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
Type :
conf
DOI :
10.1109/IVEC.2013.6571002
Filename :
6571002
Link To Document :
بازگشت