• DocumentCode
    626032
  • Title

    High average power field emitter cathode and testbed for X/Ku-band cold cathode TWT

  • Author

    Whaley, David ; Duggal, Ramon ; Armstrong, Carter ; Holland, Christopher ; Spindt, Capp ; Thibert, David

  • Author_Institution
    Electron Devices Div., L-3 Commun., San Carlos, CA, USA
  • fYear
    2013
  • fDate
    21-23 May 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A new field emitter geometry that utilizes a dielectric shield between the emitter tip and gate has been optimized to eliminate flashover in the cathode emitter cavities and improve cathode reliability. A high average power testbed has been designed and fabricated to test these cathodes at currents and current densities required for TWT operation in the X/Ku-Band frequency regime. Experimental tests in the water-cooled testbed demonstrated a record 100 hours of CW operation at 100 mA. A 200 mA X/KuBand TWT was designed to integrate these cathodes and to provide RF gain and power across the entire 6 - 18 GHz frequency band. Preliminary results taken at a cathode current of 50 mA show excellent focus of the emittance-dominated electron beam. RF results at 50 mA demonstrated positive gain over the entire frequency band with a maximum of 13.5 dB gain and 10 W output power at 10 GHz and low duty. Cathode testing as well as TWT design and preliminary operation will be described.
  • Keywords
    cathodes; electron field emission; testing; travelling wave tubes; Ku-band cold cathode TWT; X-band cold cathode TWT; cathode emitter cavity; cathode reliability; cathode testing; current 100 mA; current 200 mA; current 50 mA; emittance dominated electron beam; flashover elimination; frequency 6 GHz to 18 GHz; gain 13.5 dB; high average power field emitter cathode; power 10 W; preliminary operation; time 100 hr; travelling wave tube; water-cooled testbed; Cathodes; Current density; Electron beams; Gain; Geometry; Radio frequency; Testing; cathode test chamber; cold cathode TWT; field emitter cathode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5976-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2013.6571009
  • Filename
    6571009