• DocumentCode
    626147
  • Title

    Electrostatic focusing for a field emission electron source

  • Author

    Jabotinski, Vadim ; Khanh Nguyen ; Pasour, John ; Levush, Baruch ; Abe, D. ; Petillo, John

  • Author_Institution
    Beam-Wave Res., Inc., Bethesda, MD, USA
  • fYear
    2013
  • fDate
    21-23 May 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This paper presents theory and analysis of single-tip field emission and electron beam propagation in the electrostatic focusing fields. It is shown that two gate apertures with a focusing anode allow transport of narrow electron beams over long distances without need for a confining magnetic field. Physical mechanisms of the beam formation, transport, intrinsic emittance with thermal effects, the effects of the emission properties, and parametric studies are discussed, and a new concept and model of the bandgap-spread multilevel field emission is given.
  • Keywords
    anodes; electric fields; electron beam focusing; electron beams; electron field emission; electron sources; bandgap-spread multilevel field emission; beam formation; electron beam propagation; electrostatic focusing fields; emission properties effects; field emission electron source; focusing anode; gate apertures; intrinsic emittance; narrow electron beam transport; parametric studies; single-tip field emission; Anodes; Electron beams; Electrostatics; Focusing; Geometry; Logic gates; Periodic structures; Fowler-Nordheim; electron beam; electrostatic focusing; field emission; field emitter array; periodic waveguiding structure; terahertz;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5976-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2013.6571147
  • Filename
    6571147