• DocumentCode
    626358
  • Title

    Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing

  • Author

    Henard, Christopher ; Papadakis, Mike ; Perrouin, Gilles ; Klein, John ; Le Traon, Yves

  • Author_Institution
    Interdiscipl. Centre for Security, Reliability & Trust (SnT), Univ. of Luxembourg, Luxembourg, Luxembourg
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    188
  • Lastpage
    197
  • Abstract
    Needs for mass customization and economies of scale have pushed engineers to develop Software Product Lines (SPLs). SPLs are families of products sharing commonalities and exhibiting differences, built by reusing software assets abstractly represented by features. Feature models describe the constraints that link the features and allow the configuration of tailored software products. Common SPLs involve hundreds, even thousands of features, leading to billions of possible software products. As a result, testing a product line is challenging due to the enormous size of the possible products. Existing techniques focus on testing based on the product line´s feature model by selecting a limited set of products to test. Being created manually or reverse-engineered, feature models are prone to errors impacting the generated test suites. In this paper, we examine ability of test suites to detect such errors. In particular, we propose two mutation operators to derive erroneous feature models (mutants) from an original feature model and assess the capability of the generated original test suite to kill the mutants. Experimentation on real feature models demonstrate that dissimilar tests suites have a higher mutant detection ability than similar ones, thus validating the relevance of similarity-driven product line testing.
  • Keywords
    program diagnostics; program testing; SPL feature model; dissimilar tests suite; economies-of-scale; mass customization; model-based mutation; mutant detection ability; mutation operator; similarity-driven product line testing; software asset reuse; software product line testing; Analytical models; Biological system modeling; Context; Frequency modulation; Mobile handsets; Software; Testing; Feature Models; Mutation; Similarity; Software Product Lines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
  • Conference_Location
    Luxembourg
  • Print_ISBN
    978-1-4799-1324-4
  • Type

    conf

  • DOI
    10.1109/ICSTW.2013.30
  • Filename
    6571629