DocumentCode :
626372
Title :
Better Bounds for Event Sequencing Testing
Author :
Margalit, Oded
Author_Institution :
IBM Res., Haifa, Israel
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
281
Lastpage :
284
Abstract :
A permutation of a sequence of events is a common construction in many testing environments. Covering all possible permutations has clearly an exponential behavior; so one can ask for partial (easier) requirement, to cover all possible orders: permutations induced on of a small cardinality subset of elements. In our paper we show better (both lower and upper) bounds on this event sequencing testing problem. We also discuss another variant of the problem where we impose restrictions on the permutations. In this case we show how to achieve an exponential growth in the complexity of the problem. We also give solutions for specific cases of the problem.
Keywords :
program testing; element cardinality subset; event sequence permutation; event sequencing testing problem; exponential behavior; lower bounds; upper bounds; Arrays; Conferences; Sequential analysis; Software testing; Upper bound; Vectors; Algorithm design and analysis; combinatorial testing; covering array; event sequence testing; program testing; software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
Conference_Location :
Luxembourg
Print_ISBN :
978-1-4799-1324-4
Type :
conf
DOI :
10.1109/ICSTW.2013.39
Filename :
6571644
Link To Document :
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