Title :
Combinatorial Test Architecture Design Using Viewpoint Diagram
Author :
Nishi, Yoshio ; Katayama, Takeo ; Yoshizawa, Shingo
Author_Institution :
Univ. of Electrocommun., Tokyo, Japan
Abstract :
Software test has recently been a large-scale and complicated artifact, as is the software itself. It is necessary to reduce huge combinatorial test cases. This paper focuses on reduction of test parameters and combinations in test architectural design. First we will mention the test architecture design phase in TDLC: Test Development Life Cycle. Second we will introduce NGT: Notation for Generic Testing, which is a set of concepts or notation for design of software test architecture. This paper shows four examples of test architecture design patterns: Interaction-Viewpoint Conversion pattern, Interaction Cluster Partitioning Pattern, Interaction Demotion Pattern and Interaction Necessity Analysis.
Keywords :
program testing; software architecture; NGT; TDLC; architecture design pattern; combinatorial test architecture design; interaction cluster partitioning pattern; interaction demotion pattern; interaction necessity analysis; interaction-viewpoint conversion pattern; notation for generic testing; software test; software test architecture design; test combination reduction; test development life cycle; test parameter reduction; viewpoint diagram; Browsers; Computer architecture; Electronic mail; Planning; Software; Software testing; test architecture; test development life cycle; test viewpoint; combinatorial test; test design pattern; NGT;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
Conference_Location :
Luxembourg
Print_ISBN :
978-1-4799-1324-4
DOI :
10.1109/ICSTW.2013.82