DocumentCode
626385
Title
Coverage Specification for Test Case Intent Preservation in Regression Suites
Author
Shaccour, Elie ; Zaraket, Fadi ; Masri, Wes
Author_Institution
Dept. of Electr. & Comput. Eng., American Univ. of Beirut, Beirut, Lebanon
fYear
2013
fDate
18-22 March 2013
Firstpage
392
Lastpage
395
Abstract
Regression testing ensures that previous faults do not recur. When a fault is reported and fixed, the testing team augments the test suite with a new test case that exercises the fault in the original program. Typically the new test case covers patterns of program elements associated with the fault. However, this test might become obsolete (i.e., does not cover the targeted patterns anymore) when other code modifications are made. Nevertheless, current coverage metrics might still report acceptable values thus misleading the testing team. In this paper, we present a coverage specification language and a methodology to preserve the intent of test cases in a regression test suite. We implemented our methodology for C programs and for def-use program elements. With our method, a) a coverage specification language enables testers to specify def-use pairs and associate them with tests; b) the def-use pairs´ specifications recognize the pairs across subsequent versions of the program; and c) the tool computes run time assembly level addresses for def-use pairs and guarantees intent preservation. Preliminary results show that our method works for program changes involving insertions and deletions of several lines of code.
Keywords
C language; program testing; regression analysis; specification languages; C program; coverage specification language; def-use program element; regression testing; run time assembly level; test case intent preservation; Assembly; Conferences; Heuristic algorithms; Measurement; Software; Specification languages; Testing; Software testing; coverage; defuse coverage; regression testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
Conference_Location
Luxembourg
Print_ISBN
978-1-4799-1324-4
Type
conf
DOI
10.1109/ICSTW.2013.50
Filename
6571657
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