• DocumentCode
    626428
  • Title

    Improving Service Diagnosis through Increased Monitoring Granularity

  • Author

    Cuiting Chen ; Gross, Hans-Gerhard ; Zaidman, Andy

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2013
  • fDate
    18-20 June 2013
  • Firstpage
    129
  • Lastpage
    138
  • Abstract
    Due to their loose coupling and highly dynamic nature, service-oriented systems offer many benefits for realizing fault tolerance and supporting trustworthy computing. They enable automatic system reconfiguration in case that a faulty service is detected. Spectrum-based fault localization (SFL) is a statistics-based diagnosis technique that can effectively be applied to pinpoint problematic services. It works by monitoring service usage in system transactions and comparing service coverage with pass/fail observations. SFL exhibits poor performance in diagnosing faulty services in cases when services are tightly coupled. In this paper, we study how and to which extent an increase in monitoring granularity can help to improve correct diagnosis of tightly coupled faulty services. We apply SFL in a real service-based system, for which we show that 100% correct identification of faulty services can be achieved through an increase in the monitoring granularity.
  • Keywords
    service-oriented architecture; software fault tolerance; SFL; fault tolerance; faulty service identification; monitoring granularity; service coverage; service diagnosis; service pass-fail observation; service usage; service-based system; service-oriented software system; spectrum-based fault localization; statistics-based diagnosis technique; system reconfiguration; system transaction; trustworthy computing; Context; Couplings; Fault tolerance; Fault tolerant systems; Monitoring; Topology; Vectors; fault localization; online monitoring; residual defect; service framework; simulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Security and Reliability (SERE), 2013 IEEE 7th International Conference on
  • Conference_Location
    Gaithersburg, MD
  • Print_ISBN
    978-1-4799-0406-8
  • Type

    conf

  • DOI
    10.1109/SERE.2013.13
  • Filename
    6571703