Title :
LSGP: Line-SIFT Geometric Pattern for wide-baseline image matching
Author :
Heng Liu ; Xuejin Chen ; Jiawei Zhang ; Zhefu Tu
Author_Institution :
Dept. of Electr. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China
Abstract :
In this paper, a novel descriptor - Line-SIFT Geometric Pattern (LSGP) is proposed for wide-baseline image matching. In this descriptor, the geometry relationship between a line segment and its neighboring SIFT features is used to describe the line segments. By measuring the similarities between line segments, we could find line correspondences between multiple images which embed more intuitive information for further application such as 3D reconstruction. The experiment results have proved that our LSGP descriptor has good performance under various conditions.
Keywords :
image matching; image reconstruction; 3D reconstruction; LSGP; LSGP descriptor; SIFT features; line segment; line-SIFT geometric pattern; wide-baseline image matching; Computer vision; Feature extraction; Geometry; Image reconstruction; Image segmentation; Lighting; Robustness;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6571948
