Title :
Image enhancement for fringe projection profilometry
Author :
Ng, William Wai-Lam ; Lun, D.P.-K.
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Hong Kong, China
Abstract :
The fringe projection profilometry (FPP) is a popular approach for acquiring high-fidelity 3D model of objects. In the FPP, parallel fringe patterns are projected onto an object, and the deformed fringe as shown on the object surface is captured by a camera for 3D reconstruction. Due to the imperfection of imaging devices and operating environment, the captured fringe images however are inevitably to have many artifacts. They severely affect the robustness of the FPP and the quality of the reconstructed 3D model. In this paper, a new approach is proposed that successfully characterizes some common artifacts of fringe images, such as bias and noise, using the dual-tree complex wavelet transform. Effective methods are then devised to remove them from the fringe images. Experimental results show that the proposed algorithm is superior to the traditional methods and facilitates accurate reconstruction of objects´ 3D model even with low quality fringe images.
Keywords :
cameras; computerised instrumentation; deformation; image enhancement; image reconstruction; optical projectors; surface topography measurement; wavelet transforms; 3D image reconstruction; FPP; camera; dual-tree complex wavelet transform; fringe deformation; fringe image capturing; fringe projection profilometry; high-fidelity 3D object acquisition model; image enhancement; object projection; object surface capturing; parallel fringe pattern; Image edge detection; Image reconstruction; Noise; Noise reduction; Solid modeling; Wavelet transforms;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6571950