• DocumentCode
    626627
  • Title

    Image enhancement for fringe projection profilometry

  • Author

    Ng, William Wai-Lam ; Lun, D.P.-K.

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Hong Kong, China
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    729
  • Lastpage
    732
  • Abstract
    The fringe projection profilometry (FPP) is a popular approach for acquiring high-fidelity 3D model of objects. In the FPP, parallel fringe patterns are projected onto an object, and the deformed fringe as shown on the object surface is captured by a camera for 3D reconstruction. Due to the imperfection of imaging devices and operating environment, the captured fringe images however are inevitably to have many artifacts. They severely affect the robustness of the FPP and the quality of the reconstructed 3D model. In this paper, a new approach is proposed that successfully characterizes some common artifacts of fringe images, such as bias and noise, using the dual-tree complex wavelet transform. Effective methods are then devised to remove them from the fringe images. Experimental results show that the proposed algorithm is superior to the traditional methods and facilitates accurate reconstruction of objects´ 3D model even with low quality fringe images.
  • Keywords
    cameras; computerised instrumentation; deformation; image enhancement; image reconstruction; optical projectors; surface topography measurement; wavelet transforms; 3D image reconstruction; FPP; camera; dual-tree complex wavelet transform; fringe deformation; fringe image capturing; fringe projection profilometry; high-fidelity 3D object acquisition model; image enhancement; object projection; object surface capturing; parallel fringe pattern; Image edge detection; Image reconstruction; Noise; Noise reduction; Solid modeling; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6571950
  • Filename
    6571950