DocumentCode :
626679
Title :
Separation of weak reflection from a single superimposed image using gradient profile sharpness
Author :
Qing Yan ; Yi Xu ; Xiaokang Yang
Author_Institution :
Shanghai Key Lab. of Digital Media Process. & Transm., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
937
Lastpage :
940
Abstract :
It is a massively ill-posed problem to separate a superimposed image into an object image of our interested object and an interference image of reflection. Previous studies relied on redundant information introduced by multiple exposure or multi-view configurations in the separation. Later some new methods proposed tailor-made constraints to remove reflection in specific conditions for a single superimposed image. However, the separated results of these methods always have a lot of residuals or a few tone distortions. In this paper, we aim to realize a clear separation of weak reflection for a single superimposed image. Since the reflection is weak and always out of focus, the resulted interference image would have a smoother edge map than the object image. We utilize this smoothness constraint to obtain an initial separation by classifying gradients according to GPS (gradient profile sharpness) computation. Then we propose a gradient validation framework to reduce the structural correlation between the object image and the interference image. This framework can well correct the misclassified gradients obtained in the initial separation. The experimental results demonstrate that our method can generate promising separation results with little residual or color distortions.
Keywords :
image processing; interference (signal); gradient profile sharpness; image reflection; interference image; object image; structural correlation reduction; superimposed image; Correlation; Global Positioning System; Image color analysis; Image edge detection; Image reconstruction; Interference; Reflection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
ISSN :
0271-4302
Print_ISBN :
978-1-4673-5760-9
Type :
conf
DOI :
10.1109/ISCAS.2013.6572002
Filename :
6572002
Link To Document :
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