DocumentCode
626808
Title
0.18 μm CMOS process photodiode memory
Author
Kubota, Takahide ; Watanabe, Manabu
Author_Institution
Electr. & Electron. Eng., Shizuoka Univ., Hamamatsu, Japan
fYear
2013
fDate
19-23 May 2013
Firstpage
1464
Lastpage
1467
Abstract
Currently, demand for high-speed dynamic reconfiguration of a programmable device is increasing for raising the performance level of such devices. To support high-speed dynamic reconfiguration, optically reconfigurable gate arrays (ORGAs) have been developed to date. An ORGA consists of a holographic memory, a laser array, and an optically reconfigurable gate array VLSI. The holographic memory can store many configuration contexts. Moreover, its large-bandwidth optical connection enables high-speed reconfiguration. Nevertheless, in previously proposed ORGA-VLSIs, the static configuration memory to store a single configuration context consumed a large implementation area of the ORGA-VLSIs and prevented the realization of large-gate-count ORGA-VLSIs. Therefore, a 0.18 μιη CMOS process photodiode memory has been newly fabricated to increase the gate density of ORGAs. The photodiode memory uses the junction capacitance of photodiodes as dynamic memory, thereby obviating the static configuration memory.
Keywords
CMOS memory circuits; VLSI; photodiodes; CMOS process photodiode memory; high-speed dynamic reconfiguration; holographic memory; large-bandwidth optical connection; large-gate-count ORGA-VLSI; laser array; optically reconfigurable gate array; optically reconfigurable gate arrays; programmable device; size 0.18 mum; static configuration memory; CMOS process; Liquid crystal displays; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location
Beijing
ISSN
0271-4302
Print_ISBN
978-1-4673-5760-9
Type
conf
DOI
10.1109/ISCAS.2013.6572133
Filename
6572133
Link To Document