Title :
An analytical model of the overshooting effect for multiple-input gates in nanometer technologies
Author :
Li Ding ; Jing Wang ; Zhangcai Huang ; Kurokawa, Akira ; Inoue, Yasuyuki
Author_Institution :
Grad. Sch. of Inf., Production & Syst., Waseda Univ., Kitakyushu, Japan
Abstract :
The overshooting effect, which is induced by the input-to-output coupling capacitance, has an significant effect on CMOS gate delay with the scaling of CMOS technology. In this paper, an effective analytical model is proposed to calculate the overshooting time of multiple-input gates. The proposed model is verified having a good agreement with SPICE simulation results.
Keywords :
CMOS logic circuits; integrated circuit modelling; logic gates; nanoelectronics; CMOS gate delay; SPICE simulation; multiple-input gates; nanometer technologies; overshooting effect; Analytical models; CMOS integrated circuits; Delays; Digital audio players; Logic gates; Semiconductor device modeling; Simulation;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6572194
